Mentally Defective Children

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Mentally Defective Children
Alfred Binet (French: [binɛ]; July 8, 1857 – October 18, 1911) was a French psychologist who invented the first practical intelligence test, the Binet-Simon scale.[2] His principal goal was to identify students who needed special help in coping with the school curriculum. Along with his collaborator Théodore Simon, Binet published revisions of his intelligence scale in 1908 and 1911, the last appearing just before his death.

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Kein Miniaturbild Entfernen Bitte wähle einen Grund aus Bitte gib die Stelle im Buch an. de de_DE